ShangYuan Li
|
- Associate researcher
- Supervisor of Master's Candidates
- Name (Simplified Chinese):ShangYuan Li
- Name (Simplified Chinese):ShangYuan Li
- Name (English):ShangYuan Li
- Name (English):ShangYuan Li
- Education Level:With Certificate of Graduation for Doctorate Study
- Education Level:With Certificate of Graduation for Doctorate Study
- Professional Title:Associate researcher
- Professional Title:Associate researcher
- Status:Employed
- Status:Employed
- Alma Mater:清华大学
- Alma Mater:清华大学
- Teacher College:DZGCX
- Teacher College:DZGCX
Contact Information
No content
- Selected Publications
Measurement of the Third Order Intercept Point for a Photodiode Using Two Maximum-biased MZM
Release time:2023-05-08 Hits:
- Journal:2013 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO)
- Abstract:We proposed a simple method to measure the third-order intercept point for a photodiode using two-tone and two maximum-biased MZM. The measured IP3 of 16.04dBm agreed with that measured using traditional three-tone setup.
- First Author:Li, Shangyuan, Zheng, Xiaoping, Zhang, Hanyi, Zhou, Bingkun
- Indexed by:C
- Document Type:Proceedings Paper
- ISSN No.:2160-9020
- Translation or Not:no